Hitesh Sajnani, Vaibhav Saini, Joel Ossher, Cristina Videira Lopes. Is Popularity a Measure of Quality? An Analysis of Maven Components. In 30th IEEE International Conference on Software Maintenance and Evolution, Victoria, BC, Canada, September 29 - October 3, 2014. pages 231-240, IEEE, 2014. [doi]
Abstract is missing.