Characterization of contour regularities based on the Levenshtein edit distance

José Ignacio Abreu Salas, Juan Ramón Rico-Juan. Characterization of contour regularities based on the Levenshtein edit distance. Pattern Recognition Letters, 32(10):1421-1427, 2011. [doi]

Authors

José Ignacio Abreu Salas

This author has not been identified. Look up 'José Ignacio Abreu Salas' in Google

Juan Ramón Rico-Juan

This author has not been identified. Look up 'Juan Ramón Rico-Juan' in Google