Panel: Issues in the next generation of dependability standards

Norman F. Schneidewind, Jean-Claude Laprie, Allen P. Nikora, Michael R. Lyu, John D. Musa, Bill Everett. Panel: Issues in the next generation of dependability standards. In Ninth International Symposium on Software Reliability Engineering, ISSRE 1998, Paderborn, Germany, November 4-7, 1998. pages 101-104, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.