Fast dependency-aware feature selection in very-high-dimensional pattern recognition

Petr Somol, Jiri Grim, Pavel Pudil. Fast dependency-aware feature selection in very-high-dimensional pattern recognition. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Anchorage, Alaska, USA, October 9-12, 2011. pages 502-509, IEEE, 2011. [doi]

Abstract

Abstract is missing.