Latchup Analysis Using Emission Microscopy

Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson. Latchup Analysis Using Emission Microscopy. Microelectronics Reliability, 43(9-11):1603-1608, 2003. [doi]

Abstract

Abstract is missing.