Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson. Latchup Analysis Using Emission Microscopy. Microelectronics Reliability, 43(9-11):1603-1608, 2003. [doi]
Abstract is missing.