Desta Tadesse, R. Iris Bahar, Joel Grodstein. Fast Measurement of the Non-Deterministic Zone in Microprocessor Debug Using Maximum Likelihood Estimation. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 339-344, IEEE Computer Society, 2008. [doi]
Abstract is missing.