Automated parameter optimization of classification techniques for defect prediction models

Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, Kenichi Matsumoto. Automated parameter optimization of classification techniques for defect prediction models. In Laura K. Dillon, Willem Visser, Laurie Williams, editors, Proceedings of the 38th International Conference on Software Engineering, ICSE 2016, Austin, TX, USA, May 14-22, 2016. pages 321-332, ACM, 2016. [doi]

Abstract

Abstract is missing.