Online Next-Best-View Planning for Accuracy Optimization Using an Extended E-Criterion

Michael Trummer, Christoph Munkelt, Joachim Denzler. Online Next-Best-View Planning for Accuracy Optimization Using an Extended E-Criterion. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 1642-1645, IEEE, 2010. [doi]

Abstract

Abstract is missing.