Investigation of multi cell upset in sequential logic and validity of redundancy technique

Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka. Investigation of multi cell upset in sequential logic and validity of redundancy technique. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 7-12, IEEE, 2011. [doi]

Abstract

Abstract is missing.