deExploit: Identifying misuses of input data to diagnose memory-corruption exploits at the binary level

Run Wang, Pei Liu, Lei Zhao, Yueqiang Cheng, Lina Wang. deExploit: Identifying misuses of input data to diagnose memory-corruption exploits at the binary level. Journal of Systems and Software, 124:153-168, 2017. [doi]

Abstract

Abstract is missing.