Da Wang, Lunkai Zhang, Weizhi Xu, Dongrui Fan, Fei Wang. A SAT-based diagnosis pattern generation method for timing faults in scan chains. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2308-2312, IEEE, 2012. [doi]
Abstract is missing.