Xianming Wu, J. Jenny Li, David M. Weiss, Yann-Hang Lee. Coverage-Based Testing on Embedded Systems. In Hong Zhu, W. Eric Wong, Amit M. Paradkar, editors, Proceedings of the Second International Workshop on Automation of Software Test, AST 2007, Minneapolis, MN, USA, May 26-26, 2007. pages 31-36, IEEE, 2007. [doi]
Abstract is missing.