Using Statistical Models to Improve the Reliability of Delay-Based PUFs

Xiaolin Xu, Wayne Burleson, Daniel E. Holcomb. Using Statistical Models to Improve the Reliability of Delay-Based PUFs. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 547-552, IEEE, 2016. [doi]

Abstract

Abstract is missing.