Deep Learning for Just-in-Time Defect Prediction

Xinli Yang, David Lo, Xin Xia, Yun Zhang, Jianling Sun. Deep Learning for Just-in-Time Defect Prediction. In 2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Vancouver, BC, Canada, August 3-5, 2015. pages 17-26, IEEE, 2015. [doi]

Abstract

Abstract is missing.