Some Metrics for Accessing Quality of Product Line Architecture

Tao Zhang, Lei Deng, Jian Wu, Qiaoming Zhou, Chunyan Ma. Some Metrics for Accessing Quality of Product Line Architecture. In International Conference on Computer Science and Software Engineering, CSSE 2008, Volume 2: Software Engineering, December 12-14, 2008, Wuhan, China. pages 500-503, IEEE Computer Society, 2008. [doi]

Abstract

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