Daniel Zurita, Enric Sala, Jesus A. Carino, Miguel Delgado, Juan A. Ortega. Industrial process monitoring by means of recurrent neural networks and Self Organizing Maps. In 21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016. pages 1-8, IEEE, 2016. [doi]
Abstract is missing.