Abstract is missing.
- Experience with Rule-Based Analysis of Spacecraft LogsKlaus Havelund, Rajeev Joshi. 1-16 [doi]
- Safety, Dependability and Performance Analysis of Aerospace SystemsThomas Noll. 17-31 [doi]
- Formal Verification of Distributed Task Migration for Thermal Management in On-Chip Multi-core Systems Using nuXmvSyed Ali Asadullah Bukhari, Faiq Khalid Lodhi, Osman Hasan, Muhammad Shafique, Jörg Henkel. 32-46 [doi]
- Expression-Based Aliasing for OO-languagesGeorgiana Caltais. 47-61 [doi]
- A Normalized Form for FIFO Protocols Traces, Application to the Replay of Mode-based ProtocolsMamoun Filali, Meriem Ouederni, Jean-Baptiste Raclet. 76-92 [doi]
- Dynamic State Machines for Formalizing Railway Control System SpecificationsRoberto Nardone, Ugo Gentile, Adriano Peron, Massimo Benerecetti, Valeria Vittorini, Stefano Marrone, Renato De Guglielmo, Nicola Mazzocca, Luigi Velardi. 93-109 [doi]
- Checking the Conformance of a Promela Design to its Formal Specification in Event-BDieu-Huong Vu, Yuki Chiba, Kenro Yatake, Toshiaki Aoki. 110-126 [doi]
- A Formal Model of SysML Blocks Using CSP for Assured Systems EngineeringJaco Jacobs, Andrew C. Simpson. 127-141 [doi]
- Parallelism Analysis: Precise WCET Values for Complex Multi-Core SystemsTimon Kelter, Peter Marwedel. 142-158 [doi]
- Key-Secrecy of PACE with OTS/CafeOBJDominik Klein 0001. 159-173 [doi]
- Coalgebraic Semantic Model for the Clock Constraint Specification LanguageFrédéric Mallet, Grygoriy Zholtkevych. 174-188 [doi]
- Analyzing Industrial Architectural Models by Simulation and Model-CheckingRaluca Marinescu, Henrik Kaijser, Marius Mikucionis, Cristina Seceleanu, Henrik Lönn, Alexandre David. 189-205 [doi]
- Specifying and Verifying Concurrent C Programs with TLA+Amira Methni, Matthieu Lemerre, Belgacem Ben Hedia, Serge Haddad, Kamel Barkaoui. 206-222 [doi]
- Formal Modeling and Verification of Interlocking Systems Featuring Sequential ReleaseLinh Vu Hong, Anne Elisabeth Haxthausen, Jan Peleska. 223-238 [doi]
- A Spin-Based Approach for Checking OSEK/VDX ApplicationsHaitao Zhang, Toshiaki Aoki, Yuki Chiba. 239-255 [doi]