Abdelmadjid Benabdelmoumene - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 7 from 7

2020

Sizing of the CMOS 6T-SRAM cell for NBTI ageing mitigationAmel Chenouf, Boualem Djezzar, Hamid Bentarzi, Abdelmadjid Benabdelmoumene. iet-cds, 14(4):555-561, 2020. [doi]

2014

Does NBTI effect in MOS transistors depend on channel length?Abdelmadjid Benabdelmoumene, Boualem Djezzar, Hakim Tahi, Amel Chenouf, Mohamed Goudjil, Rafik Serhane, Fayçal Hadj Larbi, Mohamed Kechouane. icm2 2014: 52-55 [doi]

+, H and H2 as diffusion speciesMohamed Boubaaya, Hakim Tahi, Boualem Djezzar, Karim Benmassai, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Djamila Doumaz, Abdelhak Feraht Hemida. idt 2014: 231-235 [doi]

An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation ExtractionCherifa Tahanout, Hakim Tahi, Boualem Djezzar, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Bécharia Nadji. et, 30(4):415-423, 2014. [doi]

Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping techniqueHakim Tahi, Boualem Djezzar, Abdelmadjid Benabdelmoumene, Amel Chenouf, Mohamed Goudjil. mr, 54(5):882-888, 2014. [doi]

Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extractionHakim Tahi, Boualem Djezzar, Karim Benmassai, Mohamed Boubaaya, Abdelmadjid Benabdelmoumene, Amel Chenouf, Mohamed Goudjil. idt 2014: 236-241 [doi]

2013

A new procedure for eliminating the geometric component from charge pumping: Application for NBTI and radiation issuesHakim Tahi, Boualem Djezzar, Abdelmadjid Benabdelmoumene. mr, 53(4):513-519, 2013. [doi]

Sign in or sign up to see more results.

runs on WebDSL