Bram Kruseman - researchr alias

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Viewing Publication 1 - 32 from 32

2016

ETS 2016 forewordSaid Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos. ets 2016: 1 [doi]

2015

Testing of Analog/Mixed Signal ICs: Past, present and futureBram Kruseman. ets 2015: 1 [doi]

2013

2012

2011

Gate Leakage Impact on Full Open Defects in Interconnect LinesDaniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. tvlsi, 19(12):2209-2220, 2011. [doi]

Diagnosis of Interconnect Full Open Defects in the Presence of Fan-OutDaniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. tcad, 30(12):1911-1922, 2011. [doi]

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial exampleHamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing. date 2011: 371-376 [doi]

Defect Oriented Testing for analog/mixed-signal devicesBram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing. itc 2011: 1-10 [doi]

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal DevicesNivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui. dft 2011: 139-145 [doi]

2010

2008

2007

2006

Power Supply Noise in Delay TestingJing Wang 0006, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger. itc 2006: 1-10 [doi]

On test conditions for the detection of open defectsBram Kruseman, Manuel Heiligers. date 2006: 896-901 [doi]

2004

2003

Detection of Resistive Shorts in Deep Sub-micron TechnologiesBram Kruseman, Stefan van den Oetelaar. itc 2003: 866-875 [doi]

2002

Comparison of IDDQ Testing and Very-Low Voltage TestingBram Kruseman, Stefan van den Oetelaar, Josep Rius. itc 2002: 964-973 [doi]

2001

The future of delta I_DDQ testingBram Kruseman, Rudger van Veen, Kees van Kaam. itc 2001: 101-110

2000

Comparison of defect detection capabilities of current-based and voltage-based test methodsBram Kruseman. ets 2000: 175-180 [doi]

1999

Transient current testing of 0.25 /spl mu/m CMOS devicesBram Kruseman, Peter Janssen, Victor Zieren. itc 1999: 47-56

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