Giacomo Buonanno - researchr alias

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Viewing Publication 1 - 34 from 34

2021

Interacting with More Than One Chart: What Is It All About?Angela Locoro, Paolo Buono, Giacomo Buonanno. INTERACT 2021: 447-450 [doi]

2011

Interorganisational systems within SMEs aggregations: an exploratory study on information requirements of an industrial districtFederico Pigni, Aurelio Ravarini, Giacomo Buonanno, Donatella Sciuto. ijitm, 10(2/3/4):208-232, 2011. [doi]

2005

2000

ICT diffusion and strategic role within Italian SMEsGiacomo Buonanno, Stefano Gramignoli, Aurelio Ravarini, Marco Tagliavini, Donatella Sciuto. irma 2000: 373-378

An extended-UIO-based method for protocol conformance testingGiacomo Buonanno, Franco Fummi, Donatella Sciuto. jsa, 46(3):225-242, 2000. [doi]

1998

Designing for Yield: A Defect-Tolerant Approach to High-Level SynthesisMarco Broglia, Giacomo Buonanno, Mariagiovanna Sami, M. Selvini. dft 1998: 312-317 [doi]

Co-Testing: Granting Testability in a Codesign EnvironmentGiacomo Buonanno, Mariagiovanna Sami. icae, 5(1):7-18, 1998. [doi]

1997

1996

Fault detection and fault tolerance issues at CMOS level through AUED encodingCristiana Bolchini, Giacomo Buonanno, Donatella Sciuto, Renato Stefanelli. dft 1996: 258-267 [doi]

1995

1994

1993

An Expert Solution to Functional Testability Analysis of VLSI CircuitsMassimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza. seke 1993: 263-265

Reduction of Fault Detection Costs through Testable Design of Sequential Architectures with Signal FeedbacksMassimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza. dft 1993: 223-230

Functional Testing and Constrained Synthesis of Sequential ArchitecturesGiacomo Buonanno, Franco Fummi, Donatella Sciuto. iscas 1993: 1523-1526

Functional Fault Models and Gate Level Coverage for Sequential ArchitecturesGiacomo Buonanno, Franco Fummi, Donatella Sciuto. iccd 1993: 572-575

Fault Detection in Sequential Circuits through Functional TestingGiacomo Buonanno, Franco Fummi, Donatella Sciuto. dft 1993: 191-198

New CMOS Structures for the Synthesis of Dominant FunctionsGiacomo Buonanno, Donatella Sciuto, Renato Stefanelli. vlsid 1993: 367-370

Fault detection in TFCMOS/DFCMOS combinational gatesGiacomo Buonanno, Fabrizio Lombardi, Donatella Sciuto, Yinan N. Shen. integration, 15(2):201-227, 1993. [doi]

1992

A multi level testability assistant for VLSI designMassimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Donatella Sciuto, Giuseppe Zaza. eurodac 1992: 258-263 [doi]

State assignment and testability of PLA-based finite state machinesGiacomo Buonanno, Micaela Serra. jsa, 35(1-5):391-398, 1992. [doi]

1991

Optimization techniques for multiple output function synthesisGiacomo Buonanno, Donatella Sciuto, Renato Stefanelli. eurodac 1991: 545-551 [doi]

Multiple stuck-at faults detection in CMOS combinational gatesGiacomo Buonanno, Fabrizio Lombardi, Donatella Sciuto, Y.-N. Sken. jsa, 32(1-5):775-782, 1991. [doi]

1990

An approach to a design for testability personal consultantGiacomo Buonanno, A. Burri, Franco Fummi, Donatella Sciuto. jsa, 30(1-5):405-412, 1990. [doi]

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