Hideki Murakami - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 12 from 12

2019

Development of In-situ Monitoring System for Crop Growth ObservationHideki Murakami, Yoshiki Tanaka, Jun-ichi Yamashita, Rikako Takeshita, Yasunori Sakane, Takumi Okamoto, Tetsushi Koide. isdcs 2019: 1-4 [doi]

2013

2/Ge Structure by Insertion of Ta Oxide LayerKuniaki Hashimoto, Akio Ohta, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. ieicet, 96-C(5):674-679, 2013. [doi]

x/Pt MIM Diodes and Its Impact on Resistance Switching BehaviorAkio Ohta, Katsunori Makihara, Mitsuhisa Ikeda, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. ieicet, 96-C(5):702-707, 2013. [doi]

2012

Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF SputteringAkio Ohta, Yuta Goto, Shingo Nishigaki, Guobin Wei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. ieicet, 95-C(5):879-884, 2012. [doi]

2011

Characterization of Mg Diffusion into HfO::2::/SiO::2::/Si(100) Stacked Structures and Its Impact on Detect State DensitiesAkio Ohta, Daisuke Kanme, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. ieicet, 94-C(5):717-723, 2011. [doi]

Impact of Annealing Ambience on Resistive Switching in Pt/TiO::2::/Pt StructureGuobin Wei, Yuta Goto, Akio Ohta, Katsunori Makihara, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. ieicet, 94-C(5):699-704, 2011. [doi]

2010

Quantitative differences in intervertebral disc-matrix composition with age-related degenerationHideki Murakami, Tim S. Yoon, Emad S. Attallah-Wasif, Chaiwat Kraiwattanapong, Ichiro Kikkawa, William C. Hutton. mbec, 48(5):469-474, 2010. [doi]

2007

Evaluation of Dielectric Reliability of Ultrathin HfSiO::x::N::y:: in Metal-Gate CapacitorsYanli Pei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki, Seiji Inumiya, Yasuo Nara. ieicet, 90-C(5):962-967, 2007. [doi]

2005

Characterization of Germanium Nanocrystallites Grown on SiO::2:: by a Conductive AFM Probe TechniqueKatsunori Makihara, Yoshihiro Okamoto, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. ieicet, 88-C(4):705-708, 2005. [doi]

Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal NitridationHideki Murakami, Wataru Mizubayashi, Hirokazu Yokoi, Atsushi Suyama, Seiichi Miyazaki. ieicet, 88-C(4):640-645, 2005. [doi]

Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked GateHideki Murakami, Yoshikazu Moriwaki, Masafumi Fujitake, Daisuke Azuma, Seiichiro Higashi, Seiichi Miyazaki. ieicet, 88-C(4):646-650, 2005. [doi]

Charging and Discharging Characteristics of Stacked Floating Gates of Silicon Quantum DotsTaku Shibaguchi, Mitsuhisa Ikeda, Hideki Murakami, Seiichi Miyazaki. ieicet, 88-C(4):709-712, 2005. [doi]

Sign in or sign up to see more results.

runs on WebDSL