Maria Stangoni - researchr alias

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Viewing Publication 1 - 9 from 9

2011

Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applicationsMauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner. mr, 51(9-11):1479-1483, 2011. [doi]

2009

Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulationMauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner. mr, 49(9-11):972-976, 2009. [doi]

2005

Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential ContrastMarco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner. mr, 45(9-11):1499-1504, 2005. [doi]

Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor DevicesMaria Stangoni, Mauro Ciappa, Wolfgang Fichtner. mr, 45(9-11):1532-1537, 2005. [doi]

2004

+N Junction by Scanning Capacitance and Scanning Electron MicroscopyMarco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner. mr, 44(9-11):1681-1686, 2004. [doi]

On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy TechniquesMauro Ciappa, Maria Stangoni, Wolfgang Fichtner, Elisa Ricci, Andrea Scorzoni. mr, 44(9-11):1703-1708, 2004. [doi]

2003

On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devicesG. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner. mr, 43(9-11):1771-1776, 2003. [doi]

A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance MicroscopyMaria Stangoni, Mauro Ciappa, Wolfgang Fichtner. mr, 43(9-11):1651-1656, 2003. [doi]

2002

Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-JunctionMaria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner. mr, 42(9-11):1701-1706, 2002. [doi]

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