Nick M. Ridler - researchr alias

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Viewing Publication 1 - 24 from 24

2025

Metrological Traceability for the Impedance of Coaxial Devices Using an LCR MeterJames Skinner, Murat Celep, Stephen Protheroe, Nick E. Fletcher, Nick M. Ridler. tim, 74:1-9, 2025. [doi]

2024

2023

2022

3-D Printed Plug and Play Prototyping for Low-Cost Sub-THz SubsystemsSang-Hee Shin, Roshan Payapulli, Liyan Zhu, Manoj Stanley, Xiaobang Shang, Nick M. Ridler, Stepan Lucyszyn. access, 10:41708-41719, 2022. [doi]

Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNADilbagh Singh, Martin J. Salter, Susan Johny 0001, Nick M. Ridler. imm, 25(6):37-44, 2022. [doi]

Characterizing Scattering Parameters of Superconducting Quantum Integrated Circuits at Milli-Kelvin TemperaturesManoj Stanley, Sebastian De Graaf, Teresa Hönigl-Decrinis, Tobias Lindström, Nick M. Ridler. access, 10:43376-43386, 2022. [doi]

3-D Printing Quantization Predistortion Applied to Sub-THz Chained-Function FiltersLiyan Zhu, Roshan Payapulli, Sang-Hee Shin, Manoj Stanley, Nick M. Ridler, Stepan Lucyszyn. access, 10:38944-38963, 2022. [doi]

2021

2020

Characterization of Dielectric Materials at WR-15 Band (50-75 GHz) Using VNA-Based TechniqueYi Wang, Xiaobang Shang, Nick M. Ridler, Tongde Huang, Wen Wu. tim, 69(7):4930-4939, 2020. [doi]

2019

2017

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz MeasurementsMira Naftaly, Roland G. Clarke, David A. Humphreys, Nick M. Ridler. pieee, 105(6):1151-1165, 2017. [doi]

2011

Comparison Between NPL and NMIJ of Diameter and Scattering Parameter Measurements of Precision 1.85 mm Coaxial Air LinesMasahiro Horibe, Nick M. Ridler. tim, 60(7):2327-2334, 2011. [doi]

2009

Comparison Between Two National Metrology Institutes of Diameters and Characteristic Impedance of Coaxial Air LinesMasahiro Horibe, Nick M. Ridler. tim, 58(4):1084-1089, 2009. [doi]

2003

An interpolation scheme for precision intermediate frequency reflection coefficient measurementMaurice G. Cox, Mark P. Dainton, Nick M. Ridler, Martin J. Salter, P. R. Young. tim, 52(1):27-37, 2003. [doi]

Traceability via the Internet for microwave measurements using vector network analyzersRichard A. Dudley, Nick M. Ridler. tim, 52(1):130-134, 2003. [doi]

Generalized adaptive calibration schemes for precision RF vector network analyzer measurementsAndrew G. Morgan, Nick M. Ridler, Martin J. Salter. tim, 52(4):1266-1272, 2003. [doi]

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