Oleg Semenov - researchr alias

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Viewing Publication 1 - 17 from 17

2014

The Effects of Multivalency and Kinetics in Nanoscale Search by Molecular SpidersOleg Semenov, Darko Stefanovic, Milan N. Stojanovic. In Stefano Cagnoni, Marco Mirolli, Marco Villani, editors, Evolution, Complexity and Artificial Life. pages 161-175, Springer, 2014. [doi]

2013

Cooperative linear cargo transport with molecular spidersOleg Semenov, Mark J. Olah, Darko Stefanovic. nc, 12(2):259-276, 2013. [doi]

Catalytic Molecular Walkers: Aspects of Product ReleaseDarko Stefanovic, Milan N. Stojanovic, Mark J. Olah, Oleg Semenov. ecal 2013: 1134-1141 [doi]

2011

A Review of PVT Compensation Circuits for Advanced CMOS TechnologiesAndrey Malkov, Dmitry Vasiounin, Oleg Semenov. cs, 2(3):162-169, 2011. [doi]

Multiple Molecular Spiders with a Single Localized Source - The One-Dimensional Case - (Extended Abstract)Oleg Semenov, Mark J. Olah, Darko Stefanovic. dna 2011: 204-216 [doi]

Новые возможности поиска и графического представления информации базы данных по основным параметрам гигантского дипольного резонанса ядер (New Abilities in Search and Graphical Presentation for Information on the Main Parameters of Giant Dipole Resonance of Atomic Nuclei Data Base)Vladimir Varlamov, Ilya Ekhlakov, Sergey Komarov, Nickolay Peskov, Oleg Semenov, Mikhail Stepanov. rcdl 2011: 146-151 [doi]

2007

DDQ testingAlexei Kaltchenko, Oleg Semenov. iet-cds, 1(6):509-516, 2007. [doi]

Optimizing Circuit Performance and ESD Protection for High-Speed Differential I/OsHossein Sarbishaei, Oleg Semenov, Manoj Sachdev. cicc 2007: 149-152 [doi]

2006

Throughput of WLAN Systems with LDPC Codes and Adaptive Bit LoadingAndrey Belogolovy, Mikhail Yu. Lyakh, Oleg Semenov, Andrei Ovchinnikov. pimrc 2006: 1-5 [doi]

Novel gate and substrate triggering techniques for deep sub-micron ESD protection devicesOleg Semenov, H. Sarbishaei, Valery Axelrad, Manoj Sachdev. mj, 37(6):526-533, 2006. [doi]

2005

Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in EnvironmentOleg Semenov, H. Sarbishaei, Manoj Sachdev. isqed 2005: 427-432 [doi]

2004

The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustnessOleg Semenov, Hossein Sarbishaei, Valery Axelrad, Manoj Sachdev. mr, 44(9-11):1817-1822, 2004. [doi]

Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFETOleg Semenov, Michael Obrecht, Manoj Sachdev. mr, 44(9-11):1751-1755, 2004. [doi]

2003

2002

Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSIArman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi. dft 2002: 12-19 [doi]

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