Paula Diaz Reigosa - researchr alias

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Viewing Publication 1 - 11 from 11

2018

Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactionsM. Akbari, A. S. Bahman, Paula Diaz Reigosa, Francesco Iannuzzo, M. T. Bina. mr, 88:1135-1140, 2018. [doi]

Impact of meteorological variations on the lifetime of grid-connected PV invertersE. M. S. Brito, Allan Fagner Cupertino, Paula Diaz Reigosa, Yongheng Yang, V. F. Mendes, Heverton Augusto Pereira. mr, 88:1019-1024, 2018. [doi]

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modulesH. Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli. mr, 88:661-665, 2018. [doi]

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling conditionHaoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg. mr, 88:563-567, 2018. [doi]

2 dielectric in SiC power MOSFETsPaula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli. mr, 88:577-583, 2018. [doi]

2017

2016

Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overviewHaoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He. mr, 58:141-150, 2016. [doi]

Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBTPaula Diaz Reigosa, D. Prindle, Gontran Pâques, Silvan Geissmann, Francesco Iannuzzo, Arnost Kopta, Munaf Rahimo. mr, 64:524-529, 2016. [doi]

2015

Robustness of MW-Level IGBT modules against gate oscillations under short circuit eventsPaula Diaz Reigosa, Rui Wu, Francesco Iannuzzo, Frede Blaabjerg. mr, 55(9-10):1950-1955, 2015. [doi]

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