R. A. Said - researchr alias

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Viewing Publication 1 - 3 from 3

2000

Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. II. Applications, capabilities, and limitationsR. A. Said. iscas 2000: 657-660 [doi]

Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. I. Principle and demonstrationR. A. Said. iscas 2000: 681-684 [doi]

1999

Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation techniqueR. A. Said. iscas 1999: 124-128 [doi]

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