Roel J. E. Merry - researchr alias

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Viewing Publication 1 - 8 from 8

2011

Directional Repetitive Control of a Metrological AFMRoel J. E. Merry, Michael J. C. Ronde, René van de Molengraft, Richard K. Koops, Maarten Steinbuch. tcst, 19(6):1622-1629, 2011. [doi]

2009

Modeling and compensation of asymmetric hysteresis in a piezo actuated metrological AFMRoel J. E. Merry, Mustafa Uyanik, René van de Molengraft, Maarten Steinbuch, Richard K. Koops, Marijn van Veghel. amcc 2009: 967-972 [doi]

Multivariable control of a metrological Atomic Force MicroscopeMichael J. C. Ronde, Roel J. E. Merry, Marinus Jacobus Gerardus van de Molengraft, Richard K. Koops, Maarten Steinbuch. eucc 2009: 2265-2270 [doi]

2008

Modeling, identification and control of a metrological Atomic Force Microscope with a 3DOF stageRoel J. E. Merry, Mustafa Uyanik, Richard K. Koops, René van de Molengraft, Marijn van Veghel, Maarten Steinbuch. amcc 2008: 2716-2721 [doi]

2007

Control of a high precision stage using a walking piezo actuatorRoel J. E. Merry, Niels de Kleijn, René van de Molengraft, Maarten Steinbuch. IEEEcca 2007: 1285-1290 [doi]

Error modeling and improved position estimation for optical incremental encoders by means of time stampingRoel J. E. Merry, René van de Molengraft, Maarten Steinbuch. amcc 2007: 3570-3575 [doi]

Iterative Learning Control by Two-Dimensional System Theory applied to a Motion SystemWojciech Paszke, Roel J. E. Merry, René van de Molengraft. amcc 2007: 5484-5489 [doi]

2006

Removing non-repetitive disturbances in iterative learning control by wavelet filteringRoel J. E. Merry, René van de Molengraft, Maarten Steinbuch. amcc 2006: [doi]

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