Vladimir Székely - researchr alias

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Viewing Publication 1 - 24 from 24

2012

Possible acception criteria for structure functionsAlbin Szalai, Vladimir Székely. mj, 43(2):164-168, 2012. [doi]

Measurement of the time-constant spectrum: Systematic errors, correctionVladimir Székely, Albin Szalai. mj, 43(11):904-907, 2012. [doi]

2010

Fast field solver for the simulation of large-area OLEDsLászló Pohl, Zsolt Kohári, Vladimir Székely. mj, 41(9):566-573, 2010. [doi]

Evaluation of short pulse and short time thermal transient measurementsVladimir Székely. mj, 41(9):560-565, 2010. [doi]

EditorialVladimir Székely, Clemens J. M. Lasance. mj, 41(9):539, 2010. [doi]

2006

Die Attach Quality Testing by Fully Contact-less Measurement MethodGyörgy Bognár, Gyula Horváth, Zoltán Szucs, Vladimir Székely. ddecs 2006: 81-82

2003

A Fast Algorithm for the Layout Based Electro-Thermal SimulationMárta Rencz, Vladimir Székely, András Poppe. date 2003: 11032-11037 [doi]

2002

Enhancing reliability with thermal transient testingVladimir Székely. mr, 42(4-5):629-640, 2002. [doi]

2000

IDDQ Testing of Submicron CMOS - by Cooling?Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois. et, 16(5):453-461, 2000. [doi]

1999

Design and Test of MEMsBernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner. vlsid 1999: 270

1998

Tracing the Thermal Behavior of ICsVladimir Székely, Márta Rencz, Bernard Courtois. dt, 15(2):14-21, 1998. [doi]

Thermal Monitoring of Self-Checking SystemsVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois. et, 12(1-2):81-92, 1998. [doi]

Fast Field Solvers for Thermal and Electrostatic AnalysisVladimir Székely, Márta Rencz. date 1998: 518-523 [doi]

1997

CAD and Foundries for MicrosystemsJean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner. dac 1997: 674-679 [doi]

SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cellsVladimir Székely, A. Pahi, András Poppe, Márta Rencz, A. Csendes. date 1997: 617 [doi]

Electro-thermal and logi-thermal simulation of VLSI designsVladimir Székely, András Poppe, A. Pahi, A. Csendes, G. Hajas, Márta Rencz. tvlsi, 5(3):258-269, 1997. [doi]

Fast field solver-programs for thermal and electrostatic analysis of microsystem elementsVladimir Székely, Márta Rencz. iccad 1997: 684-689 [doi]

Integrating on-chip temperature sensors into DfT schemes and BIST architecturesVladimir Székely, Márta Rencz, Bernard Courtois. vts 1997: 440-445 [doi]

CMOS sensors for on-line thermal monitoring of VLSI circuitsVladimir Székely, C. Marta, Z. Kohari, Márta Rencz. tvlsi, 5(3):270-276, 1997. [doi]

1996

1995

Thermal test and monitoring [microelectronic structures]Vladimir Székely, Márta Rencz. date 1995: 601 [doi]

1993

Image recognition problems of fingerprint identificationÉva Nikodémusz-Székely, Vladimir Székely. mam, 17(4):215-218, 1993. [doi]

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