Xuerong Ye - researchr alias

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2023

2022

A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modellingXuerong Ye, Yifan Hu, Bokai Zheng, Cen Chen, Guofu Zhai. ress, 228:108815, 2022. [doi]

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation processBokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio. ress, 217:108087, 2022. [doi]

2021

2020

An Improved Empirical Mode Decomposition Based on Adaptive Weighted Rational Quartic Spline for Rolling Bearing Fault DiagnosisXuerong Ye, Yifan Hu, Junxian Shen, Rui Feng, Guofu Zhai. access, 8:123813-123827, 2020. [doi]

2018

Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shiftsHao Niu, Shujuan Wang, Xuerong Ye, Huai Wang, Frede Blaabjerg. mr, 88:453-457, 2018. [doi]

Manufacturing process-based storage degradation modelling and reliability assessmentXuerong Ye, Yigang Lin, Qingmin Wang, Hao Niu, Guofu Zhai. mr, 88:107-110, 2018. [doi]

A Joint Distribution-Based Testability Metric Estimation Model for Unreliable TestsXuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht. access, 6:42566-42577, 2018. [doi]

Fault localization of a switched mode power supply based on extended integer-coded dictionary methodXuerong Ye, Cen Chen, Guofu Zhai. mr, 88:339-344, 2018. [doi]

The threshold voltage degradation model of N Channel VDMOSFETs under PBT stressXuerong Ye, Kaixin Zhang, Cen Chen, Zhongwei Li, Yue Wang, Guofu Zhai. mr, 91:46-51, 2018. [doi]

2015

A Tolerance Design Method for Electronic Circuits Based on Performance DegradationGuofu Zhai, Yuege Zhou, Xuerong Ye. qre, 31(4):635-643, 2015. [doi]

2011

Failure Process and Dynamic Reliability Estimation of Sealed RelayXuerong Ye, Jie Deng, Qiong Yu, Guofu Zhai. ieicet, 94-C(9):1375-1380, 2011. [doi]

2009

Research on Dynamic Characteristics Testing and Analyzing System of Electromagnetic RelayXuerong Ye, Huimin Liang, Jie Deng, Guofu Zhai. ieicet, 92-C(8):1028-1033, 2009. [doi]

2006

Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability IndexHuimin Liang, Xuerong Ye, Guofu Zhai. ieicet, 89-C(8):1164-1172, 2006. [doi]

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