@inproceedings{GadkariYSRMS08, title = {AutoMOTGen: Automatic Model Oriented Test Generator for Embedded Control Systems}, author = {Ambar A. Gadkari and Anand Yeolekar and J. Suresh and S. Ramesh and Swarup Mohalik and K. C. Shashidhar}, year = {2008}, doi = {10.1007/978-3-540-70545-1_19}, url = {http://dx.doi.org/10.1007/978-3-540-70545-1_19}, tags = {control systems, testing, C++}, researchr = {https://researchr.org/publication/GadkariYSRMS08}, cites = {0}, citedby = {0}, pages = {204-208}, booktitle = {Computer Aided Verification, 20th International Conference, CAV 2008, Princeton, NJ, USA, July 7-14, 2008, Proceedings}, editor = {Aarti Gupta and Sharad Malik}, volume = {5123}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-540-70543-7}, } @inproceedings{AlurKRS08, title = {Symbolic analysis for improving simulation coverage of Simulink/Stateflow models}, author = {Rajeev Alur and Aditya Kanade and S. Ramesh and K. C. Shashidhar}, year = {2008}, doi = {10.1145/1450058.1450071}, url = {http://doi.acm.org/10.1145/1450058.1450071}, tags = {analysis, C++, coverage}, researchr = {https://researchr.org/publication/AlurKRS08}, cites = {0}, citedby = {0}, pages = {89-98}, booktitle = {Proceedings of the 8th ACM & IEEE International conference on Embedded software, EMSOFT 2008, Atlanta, GA, USA, October 19-24, 2008}, editor = {Luca de Alfaro and Jens Palsberg}, publisher = {ACM}, isbn = {978-1-60558-468-3}, } @inproceedings{KanadeAIRSS09, title = {Generating and Analyzing Symbolic Traces of Simulink/Stateflow Models}, author = {Aditya Kanade and Rajeev Alur and Franjo Ivančić and S. Ramesh and Sriram Sankaranarayanan and K. C. Shashidhar}, year = {2009}, doi = {10.1007/978-3-642-02658-4_33}, url = {http://dx.doi.org/10.1007/978-3-642-02658-4_33}, tags = {C++}, researchr = {https://researchr.org/publication/KanadeAIRSS09}, cites = {0}, citedby = {0}, pages = {430-445}, booktitle = {Computer Aided Verification, 21st International Conference, CAV 2009, Grenoble, France, June 26 - July 2, 2009. Proceedings}, editor = {Ahmed Bouajjani and Oded Maler}, volume = {5643}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-642-02657-7}, } @inproceedings{SampathRRS08, title = {Behaviour Directed Testing of Auto-code Generators}, author = {Prahladavaradan Sampath and A. C. Rajeev and S. Ramesh and K. C. Shashidhar}, year = {2008}, doi = {10.1109/SEFM.2008.13}, url = {http://dx.doi.org/10.1109/SEFM.2008.13}, tags = {testing, C++}, researchr = {https://researchr.org/publication/SampathRRS08}, cites = {0}, citedby = {0}, pages = {191-200}, booktitle = {Sixth IEEE International Conference on Software Engineering and Formal Methods, SEFM 2008, Cape Town, South Africa, 10-14 November 2008}, editor = {Antonio Cerone and Stefan Gruner}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-3437-4}, } @inproceedings{SampathRRS07, title = {Testing Model-Processing Tools for Embedded Systems}, author = {Prahladavaradan Sampath and A. C. Rajeev and S. Ramesh and K. C. Shashidhar}, year = {2007}, doi = {10.1109/RTAS.2007.39}, url = {http://doi.ieeecomputersociety.org/10.1109/RTAS.2007.39}, tags = {testing, C++, process modeling}, researchr = {https://researchr.org/publication/SampathRRS07}, cites = {0}, citedby = {0}, pages = {203-214}, booktitle = {Proceedings of the 13th IEEE Real-Time and Embedded Technology and Applications Symposium, RTAS 2007, April 3-6, 2007, Bellevue, Washington, USA}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-2800-7}, } @inproceedings{SampathRSR07, title = {How to Test Program Generators? A Case Study using flex}, author = {Prahladavaradan Sampath and A. C. Rajeev and K. C. Shashidhar and S. Ramesh}, year = {2007}, doi = {10.1109/SEFM.2007.24}, url = {http://doi.ieeecomputersociety.org/10.1109/SEFM.2007.24}, tags = {case study, testing, C++}, researchr = {https://researchr.org/publication/SampathRSR07}, cites = {0}, citedby = {0}, pages = {80-92}, booktitle = {Fifth IEEE International Conference on Software Engineering and Formal Methods (SEFM 2007), 10-14 September 2007, London, England, UK}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-2884-7}, }