External Links

    Journal: IEEE Computer

    Volume 32, Issue 11

    10 -- 0George Lawton. Storage Technology Takes Center Sstage
    25 -- 33Dennis Sylvester, Kurt Keutzer. Rethinking Deep-Submicron Circuit Design
    34 -- 41Bruce Shriver, Peter Capek. Just Curious: An Interview with John Cocke
    42 -- 45Rohit Kapur, Thomas W. Williams. Tough Challenges as Design and Test Go Nanometer - Guest Editors Introduction
    46 -- 51Robert C. Aitken. Nanometer Technology Effects on Fault Models for IC Testing
    52 -- 57Wayne M. Needham. Nanometer Technology Challenges for Test and Test Equipment
    58 -- 64Kwang-Ting Cheng, Angela Krstic. Current Directions in Automatic Test-Pattern Generation
    66 -- 74Kenneth D. Wagner. Robust Scan-Based Logic Test in VDSM Technologies
    123 -- 125Philip M. Marden Jr., Ethan V. Munson. Today s Style Sheet Standards: The Gread Vision Blinded
    126 -- 127Charles Severance. IEEE 802.11: Wireless Is Coming Home
    128 -- 130Donald J. Reifer. A Tale of Three Developers
    131 -- 133Bertrand Meyer. Every Little Bit Counts: Toward More Reliable Software
    134 -- 136Ted G. Lewis. Where the Smart Money Is?
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