| 84 | -- | 0 | Emilio Gatti. Editorial note |
| 85 | -- | 92 | F. E. Othmer. Optimum reception in digital communication systems |
| 93 | -- | 102 | Herbert J. Carlin, Pier Paolo Civalleri. Performance limitations for distributed amplifiers |
| 103 | -- | 109 | Alfred Fettweis. On assessing robustness of recursive digital filters |
| 111 | -- | 117 | Manfred Behles, Udo Unrau. Comparison of near-field and far-field methods for fiber-optic DMA measurements |
| 119 | -- | 125 | Sergio Cesare Brofferio, Giuseppe Mastronardi. A migrating data driven architecture for signal processing |
| 127 | -- | 0 | Giovanni Soncini. Focus on VLSI technology Part I: Processing and reliability: Foreword |
| 129 | -- | 136 | Livio Baldi. VLSI technologies: High performers and workhorses |
| 137 | -- | 142 | Nohuo Sasaki. Feasibility of 3D integration |
| 143 | -- | 147 | M. Gentili, A. Lucchesini, L. Scopa, P. Lugli, A. Paoletti, G. Messina, S. Santangelo, A. Tucciarone. Modeling of electron beam scattering in high resolution lithography for the fabrication of X-Ray masks |
| 149 | -- | 153 | Maurizio Severi, Maurizio Irnpronta, Paolo Negrini, Stefano Vassura. Charge trapping and interface trap generation in thin nitrided silicon dioxide films for VLSI |
| 155 | -- | 158 | P. Bellutti, C. Claeys, I. Debusschere, F. Corticelli, D. Govoni. Gate oxide thinning as related to doping effects |
| 159 | -- | 165 | Sandro Solmi, Renato Angelucci, Marco Merli. Shallow junctions for ULSI technology |
| 167 | -- | 172 | L. D. Bartholomew, N. M. Gralenski, J. C. Sisson, G. U. Pignatel. 2 deposition from TMP in APCVD |
| 173 | -- | 177 | Giorgio De Santi. Interconnections technologies for VLSI circuits |
| 179 | -- | 184 | Dipankar Pramanik, Gianpaolo Spadini. Interconnections in application specific VLSI |
| 185 | -- | 194 | E. H. A. Crannernan. Multi-level metallization: Future prospects |
| 195 | -- | 199 | Arnold Pfahnl. IC packaging and interconnections-status and trends |
| 201 | -- | 207 | Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt. 2PROM aging and endurance: A case study |
| 209 | -- | 220 | Giovanni Soncini, Claudio Canali, Enrico Zanoni, Francrsco Cors, Alessandro Diligenti, Fausto Fantini, Vito A. Monaco, Guido Masetti, Carlo Morandi. VLSI reliability: Contributions from a three year national research program |