Journal: JETC

Volume 4, Issue 3

0 -- 0Reza M. Rad, Mohammad Tehranipoor. SCT: A novel approach for testing and configuring nanoscale devices
0 -- 0Alvin R. Lebeck, Krishnendu Chakrabarty. Introduction to DAC 2007 special section
0 -- 0Tao Xu, Krishnendu Chakrabarty. Integrated droplet routing and defect tolerance in the synthesis of digital microfluidic biochips
0 -- 0Tsung-Ching Huang, Kwang-Ting (Tim) Cheng, Huai-Yuan Tseng, Chen-Pang Kung. Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver
0 -- 0Jing Li, Aditya Bansal, Swaroop Ghosh, Kaushik Roy. An alternate design paradigm for low-power, low-cost, testable hybrid systems using scaled LTPS TFTs