929 | -- | 930 | Richard W. Selby, Koji Torii. Guest Editorial Introduction: Special Issue on Software Measurement Principles, Techniques, and Environment |
931 | -- | 942 | Lionel C. Briand, Victor R. Basili, William M. Thomas. A Pattern Recognition Approach for Software Engineering Data Analysis |
943 | -- | 956 | Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong. Orthogonal Defect Classification - A Concept for In-Process Measurements |
957 | -- | 968 | Stephen G. Eick, Joseph L. Steffen, Eric E. Sumner Jr.. Seesoft-A Tool For Visualizing Line Oriented Software Statistics |
969 | -- | 979 | Yingsha Liao, Donald Cohen. A Specificational Approach to High Level Program Monitoring and Measuring |
979 | -- | 987 | Taghi M. Khoshgoftaar, John C. Munson, Bibhuti B. Bhattacharya, Gary D. Richardson. Predictive Modeling Techniques of Software Quality from Software Measures |
988 | -- | 997 | William W. Agresti, William M. Evanco. Projecting Software Defects From Analyzing Ada Designs |
998 | -- | 1010 | Michael Daskalantonakis. A Practical View of Software Measurement and Implementation Experiences Within Motorola |
1011 | -- | 1024 | Chris F. Kemerer, Benjamin S. Porter. Improving the Reliability of Function Point Measurement: An Empirical Study |
1025 | -- | 1034 | Warren Harrison. An Entropy-Based Measure of Software Complexity |