| 0 | -- | 0 | Rafic Z. Makki. Advancements in Power Supply Current Testing |
| 223 | -- | 240 | Mahmoud Al-Qutayri, Peter R. Shepherd. Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits |
| 241 | -- | 252 | Eugeni Isern, Joan Figueras. DDQ Detectable Bridges in Combinational CMOS Circuits |
| 253 | -- | 271 | Abdulnour Y. Toukmaji, Ronald Helms, Rafic Z. Makki, Wadie Mikhail, Patrick Toole. DDQ Testing Experiments for Various CMOS Logic Design Structures |
| 273 | -- | 284 | Víctor H. Champac, Joan Figueras. Current Testing of CMOS Combinational Circuits with Single Floating Gate Defects |
| 285 | -- | 298 | Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong. Operational and Test Performance in the Presence of Built-in Current Sensors |
| 299 | -- | 311 | Suntae Hwang, Rochit Rajsuman. VLSI Testing for High Reliability: Mixing IDDQ Testing With Logic Testing |