Bernhard Riedl - researchr profile publications

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Publications tagged testing

First International Conference on Software Testing, Verification, and Validation, ICST 2008, Lillehammer, Norway, April 9-11, 2008IEEE Computer Society, 2008.

Hardware and Software: Verification and Testing, Third International Haifa Verification Conference, HVC 2007, Haifa, Israel, October 23-25, 2007, ProceedingsKaren Yorav, editor, Volume 4899 of Lecture Notes in Computer Science, Springer, 2008.

Combined Correlation-Proximity Test for Breast Cancer and FibroadenomatosisRoman Andrushkiw, Dmitry Klyushin, Lyudmila Ostapchenko, Yuriy Petunin, Ivan Sirenko, Natalya Boroday. psb 2008: 285-288

An Automated Decision System for Computer Adaptive Testing Using Genetic AlgorithmsM. Phankokkruad, K. Woraratpanya. snpd 2008: 655-660 [doi]

Pushing the Boundaries of Testing and Continuous IntegrationFabrizio Cannizzo, Robbie Clutton, Raghav Ramesh. agiledc 2008: 501-505 [doi]

Modelling Short Range Alternating Transitions by Alternating Practical Test FunctionsStefan Pusca. iccS 2007: 1053-1059 [doi]

25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USAIEEE Computer Society, 2007.

Research on Resource Platform of Spacecraft TestingRen Qian, Ma Shilong. imecs 2007: 1087-1090

A Study on the Standard of Software Quality TestingHye-Jung Jung, Won-Tae Jung, Hae Sool Yang. iccsa 2006: 1052-1059 [doi]

11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UKIEEE Computer Society, 2006.

Improvement of Design Specifications with Inspection and TestingDietmar Winkler, Bernhard Riedl, Stefan Biffl. euromicro 2005: 222-231 [doi]

Locally testable cyclic codesTIT, 51(8):2849-2858, 2005. [doi]

6th International Workshop on Web Site Evolution (WSE 2004) - Testing, 11 September 2004, Chicago, IL, USAIEEE Computer Society, 2004.

The Mann-Whitney TestDanny P. Wallace. jasis, 55(1):93, 2004. [doi]

Construction of Solutions for Nonintegrable Systems with the Help of the Painleve TestS. Yu. Vernov. iccS 2004: 382-387 [doi]

SAT 2004 - The Seventh International Conference on Theory and Applications of Satisfiability Testing, 10-13 May 2004, Vancouver, BC, Canada, Online Proceedings2004.

Benefits of Modularity and Module Level TestsPatrik Kenger. ifip5-3 2005: 379-386 [doi]

Development of a Test Pattern for Measurement of Color Visual MTF PropertiesNaoyoshi Nameda. aina 2004: 2-5 [doi]

Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USAIEEE Computer Society, 2003.

Do Real Options perform better than Net Present Value? Testing in an artificial financial marketMassimo Sapienza. jasss, 6(3), 2003. [doi]

Flexible effective fragment QM/MM method: Validation through the challenging testsA. V. Nemukhin, B. L. Grigorenko, Igor A. Topol, Stanley K. Burt. jcc, 24(12):1410-1420, 2003. [doi]

Fourth International Workshop on Microprocessor Test and Verification, Common Challenges and Solutions (MTV 2003), May 29-30, 2003, Hyatt Town Lake Hotel, Austin, Texas, USAIEEE Computer Society, 2003.

Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002IEEE Computer Society, 2002.

8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, FranceIEEE Computer Society, 2002.

Correlated, Real Time Multi-spectral Sensor Test and Evaluation (T&E) in an Installed Systems Test Facility (ISTF) Using High Performance ComputingJohn Kriz, Tom Joyner, Ted Wilson, Greg McGraner. iccS 2001: 521-530 [doi]

Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001IEEE Computer Society, 2001.

Electron transfer in bis(hydrazines), a critical test for application of the Marcus modelFredrik Blomgren, Sven Larsson, Stephen F. Nelsen. jcc, 22(6):655-664, 2001. [doi]

Interactive Evaluation of the Ostensive Model Using a New Test Collection of Images with Multiple Relevance AssessmentsIain Campbell. ir, 2(1):85-112, 2000.

Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000IEEE Computer Society, 2000.

18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, CanadaIEEE Computer Society, 2000.

On the Average Sensitivity of Testing Square-Free NumbersAnna Bernasconi, Carsten Damm, Igor Shparlinski. cocoon 1999: 291-299 [doi]

Load Testing in an IR Organization: Getting By With a Little Help From My Friends Andrea L. Glaser. cmg 1999: 686-698

Testing the Performance of Multiple TCP/IP StacksJohn L. Wood, Christopher D. Selvagg, John Q. Walker II. cmg 1997: 626-638

Use of test particle calculations for the derivation of van der Waals parameters used in force fieldsJörg-Rüdiger Hill. jcc, 18(2):211-220, 1997. [doi]

14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USAIEEE Computer Society, 1996.

Flexible matching of test ligands to a 3D pharmacophore using a molecular superposition force field: Comparison of predicted and experimental conformations of inhibitors of three enzymesColin McMartin, Regine S. Bohacek. jcamd, 9(3):237-250, 1995.

Affect in Computer-Mediated and Face-to-Face Work Groups: The Construction and Testing of a General ModelJonathan A. Rhoades, Kathleen M. O Connor. cscw, 4(2/3):203-228, 1995.

Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994IEEE Computer Society, 1994.

The Complexity of Finding Replicas Using Equality TestsGudmund Skovbjerg Frandsen, Peter Bro Miltersen, Sven Skyum. mfcs 1993: 463-472

Optimal Bayesian Designs for Fatigue TestsS. Engelund, V. Bouyssy, Rüdiger Rackwitz. ifip7-5 1993: 55-63

DB2 Version 2 Release 3 Multi-User Performance Test ResultsGlynis Battersby, Peggy De Rossett. cmg 1992: 542-561

On Tests of Uniform Tree CircuitsHongzhong Wu. conpar 1992: 527-538

Electrical Characterization of Megabit DRAMs, Part 1: External TestingG. Antonin, H.-D. Oberle, Jochen Kolzer. dt, 8(3):36-43, 1991. [doi]

Algorithms for Testing the Satisfiability of Propositional FormulaeGiorgio Gallo, Giampaolo Urbani. jlp, 7(1):45-61, 1989.

A dependent data extension of Wald s identity and its application to sequential test performance computationJohn S. Sadowsky. TIT, 35(4):834-842, 1989.

Computer Usability Testing: Some Basic ConsiderationsR. H. Spencer. cmg 1985: 836-839

Inverse Pairs of Test MatricesWilhelm S. Ericksen. TOMS, 11(3):302-304, 1985. [doi]

Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982IEEE Computer Society, 1982.

Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981IEEE Computer Society, 1981.

A man-machine principle applied to human behavioral testsZ. Hantos, I. Madarász. actaC, 2:147-156, 1976.

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