Binod Kumar 0001, Kanad Basu, Ankit Jindal, Masahiro Fujita, Virendra Singh. Improving post-silicon error detection with topological selection of trace signals. In 2017 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.