Deep Learning for Industrial AI: Challenges, New Methods and Best Practices

Chetan Gupta 0001, Ahmed Farahat. Deep Learning for Industrial AI: Challenges, New Methods and Best Practices. In Rajesh Gupta 0001, Yan Liu 0002, Jiliang Tang, B. Aditya Prakash, editors, KDD '20: The 26th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Virtual Event, CA, USA, August 23-27, 2020. pages 3571-3572, ACM, 2020. [doi]

Abstract

Abstract is missing.