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Skip-scan: A methodology for test time reduction

Binod Kumar 0001, Boda Nehru, Brajesh Pandey, Jaynarayan T. Tudu. Skip-scan: A methodology for test time reduction. In 20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016. pages 1-6, IEEE, 2016. [doi]

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