Hao Huang 0001, Yanan Peng, Ting Gan, Weiping Tu, Ruiting Zhou, Sai Wu. Metric Learning via Penalized Optimization. In Feida Zhu 0002, Beng Chin Ooi, Chunyan Miao, editors, KDD '21: The 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Virtual Event, Singapore, August 14-18, 2021. pages 656-664, ACM, 2021. [doi]
Abstract is missing.