Jinfu Chen 0001, Jiaping Xu, Saihua Cai, Xiaoli Wang, Yuechao Gu, Shuhui Wang. An efficient dual ensemble software defect prediction method with neural network. In IEEE International Symposium on Software Reliability Engineering, ISSRE 2021 - Workshops, Wuhan, China, October 25-28, 2021. pages 91-98, IEEE, 2021. [doi]
Abstract is missing.