High precision optical angle measuring method applicable in standard CMOS technology

Christian Koch 0004, Jürgen Oehm, Andreas Gornik. High precision optical angle measuring method applicable in standard CMOS technology. In 35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009. pages 244-247, IEEE, 2009. [doi]

Abstract

Abstract is missing.