Amit Kumar 0013, Rama Chellappa. 2LD: Semi-Supervised Landmark Detection in Low Resolution Images and Impact on Face Verification. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 3275-3283, IEEE, 2020. [doi]
Abstract is missing.