Darren Aaberge, Ken Mockler, Dieu Van Dinh, Raoul Belleau, Tim Donovan, Reid Hewlitt. Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface with New Automatic Test Equipment Capabilities. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 75-84, IEEE Computer Society, 2005. [doi]
Abstract is missing.