Magdy S. Abadir, Jacob A. Abraham, H. Hao, C. Hunter, Wayne M. Needham, Ron G. Walther. Microprocessor Test and Validation: Any New Avenues?. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 458-464, IEEE Computer Society, 1997. [doi]
Abstract is missing.