L. Degli Abbati, R. Ullmann, G. Paganini, M. Coppetta, L. Zaia, V. Huard, O. Montfort, R. Cantoro, G. Insinga, F. Venini, P. Calao, P. Bernardi. Industrial best practice: cases of study by automotive chip- makers. In Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou, editors, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.