Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet. Defect-oriented non-intrusive RF test using on-chip temperature sensors. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
Abstract is missing.