Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma. Experiences with non-intrusive sensors for RF built-in test. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-8, IEEE Computer Society, 2012. [doi]
Abstract is missing.