Geancarlo Abich, Jonas Gava, Ricardo Reis, Luciano Ost. Soft Error Reliability Assessment of Neural Networks on Resource-constrained IoT Devices. In 27th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2020, Glasgow, Scotland, UK, November 23-25, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.