Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji. A framework to evaluate test tradeoffs in embedded core based systems-case study on TI s TMS320C27xx. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 417-425, IEEE Computer Society, 2000.
Abstract is missing.